Main features

• Non-destructive sub-micron scale microscopy of intact sample
• 3D representation over a range of scales and samples
• Resolution-at-a-Distance
• True spatial resolution of 500 nm with a minimum achievable voxel size of 40 nm
• In situ imaging for non-destructive 4D analysis in controlled environments

Xradia Versa features a combination of unique two-stage magnification optics and a high flux X-ray source to produce faster sub-micron scale resolution images. The Resolution at a Distance (RaaD) architecture enables high resolution 3D imaging of larger, denser objects including intact components and devices.